Light emitting diode and method of fabricating the same

ABSTRACT

An exemplary embodiment discloses a light emitting diode including a first light emitting cell and a second light emitting cell disposed on a substrate, the first light emitting cell and the second light emitting cell being spaced apart from each other. The light emitting diode also includes a first zinc oxide (ZnO) layer disposed on the first light emitting cell, the first ZnO layer being electrically connected to the first light emitting cell. The light emitting diode also includes a current blocking layer disposed between a portion of the first light emitting cell and the first ZnO layer, an interconnection electrically connecting the first light emitting cell and the second light emitting cell, and an insulation layer disposed between the interconnection and a side surface of the first light emitting cell. The current blocking layer and a first side of insulation layer are connected to each other.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a Continuation of U.S. patent application Ser. No.14/135,925, filed on Dec. 20, 2013, and claims priority from and thebenefit of Korean Patent Application Nos. 10-2012-0150388, filed on Dec.21, 2012, 10-2013-0029136, filed on Mar. 19, 2013, and 10-2013-0032481,filed on Mar. 27, 2013, which are hereby incorporated by reference forall purposes as if fully set forth herein.

BACKGROUND

1. Field

The present invention relates to a light emitting diode and a method offabricating the same, and more particularly, to a light emitting diodeincluding a plurality of light emitting cells connected to each othervia interconnections on a single substrate, and a method of fabricatingthe same.

2. Discussion of the Background

Gallium nitride (GaN) based light emitting diodes (LEDs) have been usedin a wide range of applications including full color LED displays, LEDtraffic sign boards, white LEDs, etc. In recent years, with higherluminous efficacy than existing fluorescent lamps, white light emittingdiodes are expected to overtake existing fluorescent lamps in the fieldof general lighting.

A light emitting diode may be driven to emit light by forward currentand require a supply of direct current. Thus, when the light emittingdiode is directly connected to an alternating current (AC) source, thelight emitting diode repeats on/off operation dependent upon a directionof electric current, and cannot continuously emit light and may beeasily damaged by reverse current.

To solve such problems of a light emitting diode, WO 2004/023568 (A1) ofSakai et. al., entitled “LIGHT-EMITTING DEVICE HAVING LIGHT-EMITTINGELEMENTS”, discloses a light emitting diode which can be used throughdirect connection to a high voltage AC source.

The AC light emitting diode of WO 2004/023568 (A1) includes a pluralityof light emitting elements connected to each other via an air bridgeinterconnection to be driven by an AC source. Such an air-bridgeinterconnection may be easily broken by external force and may causeshort circuit due to deformation by external force.

To solve such a drawback of the air bridge interconnection, AC lightemitting diodes are disclosed in Korean Patent Nos. 10-0690323 and10-1186684, for example.

FIG. 1 is a schematic plan view of a typical light emitting diodeincluding a plurality of light emitting cells, and FIG. 2 and FIG. 3 aresectional views taken along line A-A of FIG. 1.

Referring to FIG. 1 and FIG. 2, the light emitting diode includes asubstrate 21, a plurality of light emitting cells 26 including S1, S2, atransparent electrode layer 31, an insulation layer 33, and aninterconnection 35. In addition, each of the light emitting cells 26includes a lower semiconductor layer 25, an active layer 27, and anupper semiconductor layer 29, and a buffer layer 23 may be interposedbetween the substrate 21 and the light emitting cells 26.

The light emitting cells 26 are formed by patterning the lowersemiconductor layer 25, active layer 27, and upper semiconductor layer29 grown on the substrate 21, and the transparent electrode layer 31 isformed on each of the light emitting cells S1, S2. In each of the lightemitting cells 26, an upper surface of the lower semiconductor layer 25is partially exposed by partially removing the active layer 27 and theupper semiconductor layer 29 for connection to the interconnection 35.

Next, the insulation layer 33 is formed to cover the light emittingcells 26. The insulation layer 33 includes a side insulation layer 33 acovering side surfaces of the light emitting cells 26 and an insulationprotective layer 33 b covering the transparent electrode layer 31. Theinsulation layer 33 is formed with an opening through which a portion ofthe transparent electrode layer 31 is exposed and an opening throughwhich the lower semiconductor layer 25 is exposed. Then, theinterconnection 35 is formed on the insulation layer 33, in which afirst connection section 35 p of the interconnection 35 is connected tothe transparent electrode layer 31 of one light emitting cell S1 throughthe opening of the insulation layer 33, and a second connection section35 n of the interconnection 35 is connected to the lower semiconductorlayer 25 of another light emitting cell S2 adjacent the one lightemitting cell S1 through the other opening of the insulation layer 33.The second connection section 35 n is connected to an upper surface ofthe lower semiconductor layer 25, which is exposed by partially removingthe active layer 27 and the upper semiconductor layer 29.

In a conventional technique, the interconnection 35 is formed on theinsulation layer 33 and thus may be prevented from deformation byexternal force. In addition, since the interconnection 35 is separatedfrom the light emitting cells 26 by the side insulation layer 33 a, itis possible to prevent short circuit of the light emitting cells 26 bythe interconnection 35.

However, such a conventional light emitting diode may have a limit incurrent spreading in areas of the light emitting cells 26. Specifically,electric current may be concentrated under one end of theinterconnection 35 connected to the transparent electrode layer 31instead of being evenly spread in the areas of the light emitting cells26. Current crowding may become severe with increasing current density.

Moreover, such a conventional light emitting diode may have problems inthat some of the light generated in the active layer 27 may be absorbedand lost by the interconnection 35, and the thickness of the insulationlayer 33 may need to be increased to prevent formation of defects suchas pin-holes and the like.

Furthermore, since a portion of the upper surface of the lowersemiconductor layer 25 is exposed for electric connection of the secondconnection section 35 n, the active layer 27 and the upper semiconductorlayer 29 are partially removed, and may thereby reduce an effectivelight emitting area.

In order to prevent current crowding, a current blocking layer 30 may bedisposed between the transparent electrode layer 31 and the lightemitting cells 26 to prevent current crowding under the connection endof the interconnection 35.

FIG. 3 is a sectional view of a light emitting diode including a currentblocking layer 30 in the related art.

Referring to FIG. 1 and FIG. 3, the current blocking layer 30 isdisposed under the connection end of the interconnection 35, and maythereby prevent current crowding under the connection end of theinterconnection 35. In addition, the current blocking layer 30 may beformed as a reflector such as a distributed Bragg reflector, and maythereby prevent light generated in the active layer 27 from beingabsorbed into the connection end of the interconnection 35.

However, when the current blocking layer 30 is additionally formed asshown in FIG. 3, a photolithography process for forming the currentblocking layer 30 is added, and may thereby increase manufacturingcosts.

Moreover, as in the light emitting diode of FIG. 2, the light emittingdiode of FIG. 3 may also have problems, such as optical loss due toabsorption of light generated in the active layer 27 by theinterconnection 35, reduction in effective light emitting area, andincrease in thickness of the insulation layer 33 to prevent defects suchas pinholes in the insulation layer 33.

SUMMARY OF THE INVENTION

Exemplary embodiments of the present invention provide a light emittingdiode, which may employ a current blocking layer while preventingincrease in the number of photolithography processes, and a method offabricating the same.

Exemplary embodiments of the present invention also provide a lightemitting diode capable of reducing absorption of light by aninterconnection, and a method of fabricating the same.

Exemplary embodiments of the present invention also provide a lightemitting diode, which includes a plurality of light emitting cells eachhaving an increased effective light emitting area, and a method offabricating the same.

Additional features of the invention will be set forth in thedescription which follows, and in part will be apparent from thedescription, or may be learned by practice of the invention.

An exemplary embodiment discloses a light emitting diode including afirst light emitting cell and a second light emitting cell disposed on asubstrate, the first light emitting cell and the second light emittingcell being spaced apart from each other. The light emitting diode alsoincludes a first zinc oxide (ZnO) layer disposed on the first lightemitting cell, the first ZnO layer being electrically connected to thefirst light emitting cell. The light emitting diode also includes acurrent blocking layer disposed between a portion of the first lightemitting cell and the first ZnO layer, an interconnection electricallyconnecting the first light emitting cell and the second light emittingcell, and an insulation layer disposed between the interconnection and aside surface of the first light emitting cell. The current blockinglayer and a first side of insulation layer are connected to each other.

The current blocking layer and the insulation layer include distributedBragg reflectors.

The current blocking layer and the insulation layer are disposed betweenthe first light emitting cell and the interconnection in an entireoverlapping area between the first light emitting cell and theinterconnection.

The insulation layer is disposed between the interconnection and theside surface of the second light emitting cell.

The light emitting diode further includes an insulation protective layerdisposed on the first light emitting cell and the second light emittingcell, the insulation protective layer being disposed outside an area inwhich the interconnection is disposed.

A side surface of the insulation protective layer contacts a sidesurface of the interconnection on a coplanar surface.

The light emitting diode further includes a first transparent conductivelayer disposed between the insulation layer and the interconnection.

The first transparent conductive layer is connected to the first ZnOlayer.

Each of the first and second light emitting cells includes a lowersemiconductor layer, an upper semiconductor layer, and an active layerdisposed between the lower semiconductor layer and the uppersemiconductor layer. The first ZnO layer is electrically connected tothe upper semiconductor layer. The interconnection contacts the firstZnO layer at a first end thereof and the lower semiconductor layer ofthe second light emitting cell at a second end thereof.

The interconnection is directly connected to the first ZnO layer over anentire overlapping area therebetween.

The current blocking layer is disposed at least under the directconnection area between the first ZnO layer and the interconnection.

The first light emitting cell and the second light emitting cell includethe same structure.

The current blocking layer and the insulation layer include distributedBragg reflectors including the same structure, and include the samematerial.

The interconnection is directly connected to the first ZnO layer over anentire overlapping area therebetween.

The distributed Bragg reflectors are disposed under the interconnectionover an entire area of the interconnection.

The second light emitting cell has an inclined side surface, and theinterconnection includes a first connection section connected to thefirst light emitting cell and a second connection section connected tothe second light emitting cell, the first connection section contactingthe first ZnO layer within an upper area of the current blocking layer,the second connection section contacting the inclined side surface ofthe second light emitting cell.

An exemplary embodiment also discloses a light emitting diode includinga first light emitting cell and a second light emitting cell disposed ona substrate, the first light emitting cell and the second light emittingbeing spaced apart from each other. The light emitting diode alsoincludes a first transparent electrode layer disposed on the first lightemitting cell, the first transparent electrode layer being electricallyconnected to the first light emitting cell. The light emitting diodealso includes a current blocking layer disposed between a portion of thefirst light emitting cell and the first transparent electrode layer, aninterconnection electrically connecting the first light emitting celland the second light emitting cell, and an insulation layer disposedbetween the interconnection and a first side surface of the first lightemitting cell. The current blocking layer and the insulation layer areconnected to each other. The first transparent electrode layer isextended to cover a second side surface of the insulation layer. Thefirst side surface is opposite to the second side surface.

At least one of the current blocking layer and the insulation layerinclude distributed Bragg reflectors.

It is to be understood that both the foregoing general description andthe following detailed description are exemplary and explanatory and areintended to provide further explanation of the invention as claimed.

BRIEF DESCRIPTION OF THE DRAWINGS

The accompanying drawings, which are included to provide a furtherunderstanding of the invention and are incorporated in and constitute apart of this specification, illustrate embodiments of the invention, andtogether with the description serve to explain the principles of theinvention.

FIG. 1 is a schematic plan view of a light emitting diode in the relatedart.

FIG. 2 and FIG. 3 are schematic sectional views taken along line A-A ofFIG. 1.

FIG. 4 is a schematic sectional view of a light emitting diode accordingto an exemplary embodiment of the present invention.

FIGS. 5, 6, 7, 8, 9, 10, and 11 are schematic sectional viewsillustrating a method of fabricating a light emitting diode according tothe exemplary embodiment of FIG. 4.

FIG. 12 is a schematic sectional view of a light emitting diodeaccording to an exemplary embodiment of the present invention.

FIGS. 13, 14, 15, and 16 are schematic sectional views illustrating amethod of fabricating a light emitting diode according to the exemplaryembodiment of FIG. 12.

FIG. 17 is a schematic plan view of a light emitting diode according toan exemplary embodiment of the present invention.

FIG. 18 is a schematic sectional view taken along line B-B of FIG. 17.

FIGS. 19, 20, 21, 22, 23, 24, and 25 are schematic sectional viewsillustrating a method of fabricating a light emitting diode according tothe exemplary embodiment of FIG. 18.

FIG. 26 is a schematic plan view of a light emitting diode according toan exemplary embodiment of the present invention.

FIGS. 27, 28, 29, and 30 are schematic sectional views illustrating amethod of fabricating a light emitting diode according to the exemplaryembodiment of FIG. 26.

DETAILED DESCRIPTION OF THE ILLUSTRATED EMBODIMENTS

The invention is described more fully hereinafter with reference to theaccompanying drawings, in which embodiments of the invention are shown.This invention may, however, be embodied in many different forms andshould not be construed as limited to the embodiments set forth herein.Rather, these embodiments are provided so that this disclosure isthorough, and will fully convey the scope of the invention to thoseskilled in the art. In the drawings, the size and relative sizes oflayers and regions may be exaggerated for clarity. Like referencenumerals in the drawings denote like elements.

It will be understood that when an element or layer is referred to asbeing “on” or “connected to” another element or layer, it can bedirectly on or directly connected to the other element or layer, orintervening elements or layers may be present. In contrast, when anelement is referred to as being “directly on” or “directly connected to”another element or layer, there are no intervening elements or layerspresent. It will be understood that for the purposes of this disclosure,“at least one of X, Y, and Z” can be construed as X only, Y only, Zonly, or any combination of two or more items X, Y, and Z (e.g., XYZ,XYY, YZ, ZZ).

Spatially relative terms, such as “beneath”, “below”, “lower”, “above”,“upper” and the like, may be used herein for ease of description todescribe one element or feature's relationship to another element(s) orfeature(s) as illustrated in the figures. It will be understood that thespatially relative terms are intended to encompass differentorientations of the device in use or operation in addition to theorientation depicted in the figures. For example, if the device in thefigures is turned over, elements described as “below” or “beneath” otherelements or features would then be oriented “above” the other elementsor features. Thus, the exemplary term “below” can encompass both anorientation of above and below. The device may be otherwise oriented(rotated 90 degrees or at other orientations) and the spatially relativedescriptors used herein interpreted accordingly.

FIG. 4 is a schematic sectional view of a light emitting diode accordingto an exemplary embodiment of the present invention.

Referring to FIG. 4, a light emitting diode according to one embodimentof the invention includes a substrate 51, light emitting cells S1, S2, atransparent electrode layer 61, a current blocking layer 60 a, aninsulation layer 60 b, an insulation protective layer 63, and aninterconnection 65. The light emitting diode may further include abuffer layer 53.

The substrate 51 may be an insulating or conductive substrate. Forexample, the substrate 51 may be a sapphire substrate, a gallium nitridesubstrate, a silicon carbide (SiC) substrate, or a silicon substrate. Ona single substrate 51, the first light emitting cell S1 and the secondlight emitting cell S2 are separated from each other. Each of the firstand second light emitting cells S1, S2 has a stack structure 56, whichincludes a lower semiconductor layer 55, an upper semiconductor layer 59disposed on one area of the lower semiconductor layer, and an activelayer 57 interposed between the lower semiconductor layer and the uppersemiconductor layer. Here, the upper and lower semiconductor layers maybe p-type and n-type semiconductor layers, respectively, or vice versa.

Each of the lower semiconductor layer 55, the active layer 57 and theupper semiconductor layer 59 may be formed of a gallium nitride-basedmaterial, for example, (Al, In, Ga)N. The active layer 57 may be formedof a material having a composition capable of emitting light in adesired wavelength range, for example, ultra violet (UV) light or bluelight, and the lower and upper semiconductor layers 55, 59 are formed ofa material having a wider band gap than that of the active layer 57.

As shown, the lower semiconductor layer 55 and/or the uppersemiconductor layer 59 may be formed of a single layer or multiplelayers. In addition, the active layer 57 may have a single quantum-wellstructure or a multi-quantum well structure.

Each of the first and second light emitting cells S1, S2 may have aninclined side surface, an inclined angle of which ranges from 15° to 80°with respect to an upper surface of the substrate 51. Although notshown, the lower semiconductor layer 55 may have a stepped portionformed along a sidewall thereof.

The active layer 57 and the upper semiconductor layer 59 are disposed onsome area of the lower semiconductor layer 55, and the other area of thelower semiconductor layer 55 is exposed as shown in FIG. 4. Although theside surfaces of the active layer 57 and upper semiconductor layer 57are shown as being vertical side surfaces in FIG. 4, it should beunderstood that these side surfaces may also be inclined.

In FIG. 4, the first light emitting cell S1 and the second lightemitting cell S2 are partially shown. However, it should be noted thatthe first light emitting cell S1 and the second light emitting cell S2have a similar or the same structure. Specifically, the first and secondlight emitting cells S1, S2 have the same stack structure, and some areaof the lower semiconductor layer 55 of the first light emitting cell S1is exposed as in some area of the lower semiconductor layer 55 of thesecond light emitting cell S2.

The buffer layer 53 may be interposed between the light emitting cellsS1, S2 and the substrate 51. The buffer layer 53 is used to relievelattice mismatch between the substrate 51 and the lower semiconductorlayer 55 when the substrate 51 is a growth substrate.

The transparent electrode layer 61 is disposed on each of the lightemitting cells S1, S2. Specifically, a first transparent electrode layer61 is disposed on the first light emitting cell S1, and a secondtransparent electrode layer 61 is disposed on the second light emittingcell S2. The transparent electrode layer 61 may be disposed on an uppersurface of the upper semiconductor layer 59 to be connected to the uppersemiconductor layer 59, and may have a smaller area than that of theupper semiconductor layer 59. In other words, the transparent electrodelayer 61 may be recessed from an edge of the upper semiconductor layer59. Thus, the light emitting diode according to this embodiment mayprevent current crowding at the edge of the transparent electrode layer61 through the sidewalls of the light emitting cells S1, S2.

The current blocking layer 60 a may be disposed on each of the lightemitting cells S1, S2 between the transparent electrode layer 61 andeach of the light emitting cells S1, S2. Particularly, the currentblocking layer 60 a is disposed near one edge of the first lightemitting cell S1, and a portion of the transparent electrode layer 61 isdisposed on the current blocking layer 60 a. The current blocking layer60 a is formed of an insulation material, and particularly, may includea distributed Bragg reflector formed by alternately stacking layershaving different indices of refraction.

The insulation layer 60 b covers a portion of the side surface of thefirst light emitting cell S1. As shown in FIG. 4, the insulation layer60 b extends to cover a portion of a side surface of the lowersemiconductor layer 55 of the second light emitting cell S2. Theinsulation layer 60 b has the same structure as that of the currentblocking layer 60 a and is formed of the same material as that of thecurrent blocking layer 60 a, and may include a distributed Braggreflector. When the insulation layer 60 b includes the distributed Braggreflector formed of multiple layers, it is possible to efficientlysuppress formation of defects such as pinholes in the insulation layer60 b. Alternatively, the insulation layer 60 b may be separated from thecurrent blocking layer 60 a.

The interconnection 65 electrically connects the first light emittingcell S1 to the second light emitting cell S2. The interconnection 65 iselectrically connected at one end thereof to the transparent electrodelayer 61 on the first light emitting cell S1 and at the other endthereof to the lower semiconductor layer 55 of the second light emittingcell S2, whereby the first light emitting cell S1 can be directlyconnected in series to the second light emitting cell S2.

The interconnection 65 may contact the transparent electrode layer 61over an entire overlapping area between the interconnection 65 and thetransparent electrode layer 61. In the related art, a portion of theinsulation layer 33 is disposed between the transparent electrode layer31 and the interconnection 35. However, in this embodiment, theinterconnection 65 directly contacts the transparent electrode layer 61without any insulating material interposed therebetween.

Further, the current blocking layer 60 a may be disposed over an entireoverlapping area between the interconnection 65 and the transparentelectrode layer 61, and the current blocking layer 60 a and theinsulation layer 60 b may be disposed over an entire overlapping areabetween the interconnection 65 and the first light emitting cell S1. Inaddition, the insulation layer 60 b may be disposed between the secondlight emitting cell S2 and the interconnection 65 except for aconnection area between the interconnection 65 and the second lightemitting cell S2.

When the current blocking layer 60 a and the insulation layer 60 b havereflective characteristics like distributed Bragg reflectors, thecurrent blocking layer 60 a and the insulation layer 60 b may besubstantially within the same area as that of the interconnection 65 inan area two times or less than that of the interconnection 65. Thecurrent blocking layer 60 a and the insulation layer 60 b preventabsorption of light by the interconnection 65 when light is emitted fromthe active layer 57. However, when the current blocking layer 60 a andthe insulation layer 60 b occupy an excessively large area, there is apossibility of blocking discharge of light. Thus, it may be necessary tolimit the area of the current blocking layer 60 a and the insulationlayer 60 b.

The insulation protective layer 63 may be disposed outside the area ofthe interconnection 65. The insulation protective layer 63 covers thefirst and second light emitting cells S1, S2 outside the area of theinterconnection 65. The insulation protective layer 63 may be formed ofa silicon oxide layer (SiO₂) or a silicon nitride layer. The insulationprotective layer 63 is formed with an opening through which thetransparent electrode layer 61 on the first light emitting cell S1 andthe lower semiconductor layer of the second light emitting cell S2 areexposed, and the interconnection 65 may be disposed within this opening.

A side surface of the insulation protective layer 63 and a side surfaceof the interconnection 65 may be disposed to face each other, or tocontact each other. Alternatively, the side surface of the insulationprotective layer 63 may be separated from the side surface of theinterconnection 65 to face each other.

According to this embodiment, the current blocking layer 60 a and theinsulation layer 60 b may be formed of the same material and have thesame structure, and thus may be formed by the same process. In addition,since the interconnection 65 is disposed within the opening of theinsulation protective layer 63, the insulation protective layer 63 andthe interconnection 65 may be formed using the same mask pattern.

In this embodiment, the light emitting diode is illustrated as includingtwo light emitting cells, that is, the first light emitting cell S1 andthe second light emitting cell S2. However, the present invention is notlimited to the two light emitting cells, and more light emitting cellsmay be electrically connected to each other by interconnections 65. Forexample, the interconnections 65 may electrically connect the lowersemiconductor layers 55 of adjacent light emitting cells to thetransparent electrode layers 61 thereof to form a series array of thelight emitting cells. The light emitting diode according to thisembodiment may include a plurality of such arrays, which is connected toeach other in reverse parallel and connected to an AC source. Inaddition, the light emitting diode may be provided with a bridgerectifier (not shown) connected to the series array of light emittingcells, such that the light emitting cells can be driven by an AC source.The bridge rectifier may be formed by connecting the light emittingcells having the same structure as that of the light emitting cells S1,S2 using the interconnections 65.

FIG. 5 to FIG. 11 are sectional views illustrating a method offabricating a light emitting diode according to one embodiment of thepresent invention.

Referring to FIG. 5, a semiconductor stack structure 56 is formed on asubstrate 51, and includes a lower semiconductor layer 55, an activelayer 57 and an upper semiconductor layer 59. In addition, beforeformation of the lower semiconductor layer 55, a buffer layer 53 may beformed on the substrate 51.

The substrate 51 may be a sapphire (Al₂O₃) substrate, a silicon carbide(SiC) substrate, a zinc oxide (ZnO) substrate, a silicon (Si) substrate,a gallium arsenide (GaAs), a gallium phosphide (GaP) substrate, alithium alumina (LiAl₂O₃) substrate, a boron nitride (BN) substrate, analuminum nitride (AlN) substrate, or a gallium nitride (GaN) substrate,without being limited thereto. That is, the substrate 51 may be selectedfrom among various materials dependent upon materials of semiconductorlayers to be formed thereon.

The buffer layer 53 is formed to relieve lattice mismatch between thesubstrate 51 and the semiconductor layer 55 formed thereon, and may beformed of, for example, gallium nitride (GaN) or aluminium nitride(AlN). When the substrate 51 is a conductive substrate, the buffer layer53 may be formed as an insulation layer or a semi-insulation layer, forexample, AlN or semi-insulation GaN.

Each of the lower semiconductor layer 55, the active layer 57 and theupper semiconductor layer 59 may be formed of a gallium nitride-basedsemiconductor material, for example, (Al, In, Ga)N. The lower and uppersemiconductor layers 55, 59 and the active layer 57 may bediscontinuously or continuously formed by metal organic chemical vapordeposition (MOCVD), molecular beam epitaxy, hydride vapor phase epitaxy(HYPE), and the like.

Here, the lower and upper semiconductor layers are n-type and p-typesemiconductor layers, respectively, or vice versa. The n-typesemiconductor layer is formed by doping a gallium nitride-based compoundsemiconductor layer with, for example, silicon (Si) impurities, and thep-type semiconductor layer is formed by doping the gallium nitride-basedcompound semiconductor layer with, for example, magnesium (Mg)impurities.

Referring to FIG. 6, a plurality of light emitting cells S1, S2 isformed to be separated from each other by photolithography and etching.Each of the light emitting cells 51, S2 has an inclined side surface,and the lower semiconductor layer 55 of each of the light emitting cellsS1, S2 is partially exposed.

In each of the light emitting cells S1, S2, the lower semiconductorlayer 55 is first exposed by mesa-etching, and the light emitting cellsare separated from each other by a cell isolation process.Alternatively, the light emitting cells S1, S2 may be first separatedfrom each other by the cell isolation process, and then are subjected tomesa etching to expose the lower semiconductor layers 55 thereof.

Referring to FIG. 7, a current blocking layer 60 a covering a partialarea of the first light emitting cell S1 is formed together with aninsulation layer 60 b covering a partial area of a side surface of thefirst light emitting cell S1. The insulation layer 60 b may also extendto cover a portion of a side surface of the lower semiconductor layer 55of the second light emitting cell S2.

The current blocking layer 60 a and the insulation layer 60 b may beformed by depositing an insulation material layer, followed bypatterning the insulation material layer through photolithography andetching. Alternatively, the current blocking layer 60 a and theinsulation layer 60 b may be formed of an insulation material through alift-off process. In particular, the current blocking layer 60 a and theinsulation layer 60 b may be formed as distributed Bragg reflectors byalternately stacking layers having different indices of refraction, forexample, a SiO₂ layer and a TiO₂ layer. When the insulation layer 60 bis a distributed Bragg reflector formed of multiple layers, it ispossible to prevent formation of defects such as pinholes in theinsulation layer 60 b, whereby the insulation layer 60 b may be formedto be relatively thin as compared with conventional techniques.

As shown in FIG. 7, the current blocking layer 60 a and the insulationlayer 60 b may be connected to each other, without being limitedthereto.

Next, a transparent electrode layer 61 is formed on the first and secondlight emitting cells S1, S2. The transparent electrode layer 61 may beformed of a conductive material such as indium tin oxide (ITO) or zincoxide, or a metal layer such as Ni/Au. The transparent electrode layer61 is connected to the upper semiconductor layer 59 and is partiallydisposed on the current blocking layer 60 a. The transparent electrodelayer 61 may be formed by a lift-off process, without being limitedthereto. Alternatively, the transparent electrode layer 61 may be formedby photolithography and etching.

Referring to FIG. 8, an insulation protective layer 63 is formed tocover the first and second light emitting cells S1, S2. The insulationprotective layer 63 covers the transparent electrode layer 61 and theinsulation layer 60 b. In addition, the insulation protective layer 63may cover an overall area of the first and second light emitting cellsS1, S2. The insulation protective layer 63 may be formed as aninsulation material layer such as a silicon oxide layer or a siliconnitride layer by chemical vapor deposition or the like.

Referring to FIG. 9, a mask pattern 70 having an opening is formed onthe insulation protective layer 63. The opening of the mask pattern 70corresponds to an area of the interconnection. Next, some region of theinsulation protective layer 63 is etched using the mask pattern 70 as amask. As a result, an opening is formed in the insulation protectivelayer 63 to expose some of the transparent electrode layer 61 and theinsulation layer 60 b, and the lower semiconductor layer 55 of thesecond light emitting cell S2 therethrough.

Referring to FIG. 10, with the mask pattern 70 remaining on theinsulation protective layer 63, a conductive material is deposited toform an interconnection 65 in the opening of the mask pattern 70. Atthis point, a portion 65 a of the conductive material may be depositedon the mask pattern 70. The conductive material may be deposited byplating, electron-beam evaporation or sputtering.

Referring to FIG. 11, the mask pattern 70 is removed together with theportion 65 a of the conductive material on the mask pattern 70.Accordingly, the interconnection 65 electrically connecting the firstand second light emitting cells S1, S2 to each other is finally formed.

Here, one end of the interconnection 65 is connected to the transparentelectrode layer 61 of the first light emitting cell S1, and the otherend thereof to the lower semiconductor layer 55 of the second lightemitting cell S2. In addition, the one end of the interconnection 65 isconnected to the transparent electrode layer 61 within an upper area ofthe current blocking layer 60 a. The interconnection 65 is separatedfrom the side surface of the first light emitting cell Si and the sidesurface of the second light emitting cell S2 via the insulation layer 60b. Furthermore, the interconnection 65 is disposed within the upper areaof the current blocking layer 60 a and the insulation layer 60 b exceptfor a portion of the interconnection 65 electrically connected to thelower semiconductor layer 55 of the second light emitting cell S2.

In this embodiment, the current blocking layer 60 a and the insulationlayer 60 b are formed by the same process. Accordingly, the insulationprotective layer 63 and the interconnection 65 may be formed using thesame mask pattern 70, whereby the light emitting diode can be fabricatedusing the same number of exposure processes while adding the currentblocking layer 60 a.

FIG. 12 is a schematic sectional view of a light emitting diodeaccording to an exemplary embodiment of the present invention.

Referring to FIG. 12, the light emitting diode according to thisembodiment is generally similar to the light emitting diode describedwith reference to FIG. 4, and further includes a transparent conductivelayer 62.

In the light emitting diode according to this embodiment, a substrate51, light emitting cells S1, S2, a buffer layer 53, a transparentelectrode layer 61, a current blocking layer 60 a, an insulation layer60 b, an insulation protective layer 63 and an interconnection 65 aresimilar to those of the light emitting diode according to the aboveembodiment described with reference to FIG. 4, and detailed descriptionsthereof will be omitted.

The transparent conductive layer 62 is disposed between the insulationlayer 60 b and the interconnection 65. The transparent conductive layer62 has a narrower line width than the insulation layer 60 b, therebypreventing short circuit of the upper semiconductor layer 59 and thelower semiconductor layer 55 due to the transparent conductive layer 62.That is, when the insulation layer 60 b is thicker than the transparentconductive layer 62, the insulation layer 60 b may prevent a shortcircuit.

On the other hand, the transparent conductive layer 62 is connected tothe first transparent electrode layer 61, and may connect the firsttransparent electrode layer 61 to the second light emitting cell S2. Forexample, one end of the transparent conductive layer 62 may beelectrically connected to the lower semiconductor layer 55 of the secondlight emitting cell. In addition, when two or more light emitting cellsare connected to each other, a second transparent conductive layer 62may extend from a second transparent electrode layer 61 on the secondlight emitting cell S2.

In this embodiment, since the transparent conductive layer 62 isdisposed between the interconnection 65 and the insulation layer 60 b,electric current can flow through the transparent conductive layer 62even in the case where the interconnection 65 is disconnected, therebyimproving electrical stability of the light emitting diode.

FIG. 13 to FIG. 16 are schematic sectional views illustrating a methodof fabricating a light emitting diode according to the present exemplaryembodiment.

Referring to FIG. 13, as in the method described with reference to FIG.5 and FIG. 6, a semiconductor stack structure 56 is formed on asubstrate 51 and a plurality of light emitting cells S1, S2 is formed tobe separated from each other via photolithography and etching. Then, asdescribed with reference to FIG. 7, a current blocking layer 60 acovering a partial area of the first light emitting cell S1 is formedtogether with an insulation layer 60 b covering a partial area of a sidesurface of the first light emitting cell S1. The insulation layer 60 bmay also extend to cover a portion of a side surface of the lowersemiconductor layer 55 of the second light emitting cell S2.

As described with reference to FIG. 7, the current blocking layer 60 aand the insulation layer 60 b may be formed as distributed Braggreflectors by alternately stacking layers having different indices ofrefraction, for example, a SiO2 layer and a TiO2 layer. When theinsulation layer 60 b is a distributed Bragg reflector formed ofmultiple layers, it is possible to prevent formation of defects such aspinholes in the insulation layer 60 b, whereby the insulation layer 60 bmay be formed to be relatively thin as compared with conventionaltechniques.

Next, a transparent electrode layer 61 is formed on the first and secondlight emitting cells S1, S2. As described with reference to FIG. 7, thetransparent electrode layer 61 may be formed of a conductive materialsuch as indium tin oxide (ITO) or zinc oxide, or a metal layer such asNi/Au. The transparent electrode layer 61 is connected to the uppersemiconductor layer 59 and is partially disposed on the current blockinglayer 60 a. The transparent electrode layer 61 may be formed by alift-off process, without being limited thereto. Alternatively, thetransparent electrode layer 61 may be formed by photolithography andetching.

During formation of the transparent electrode layer 61, a transparentconductive layer 62 is also formed. The transparent conductive layer 62may be formed of the same material as that of the transparent electrodelayer 61 through the same process. The transparent conductive layer 62is formed on the insulation layer 60 b, and may be connected to thetransparent electrode layer 61. Further, one end of the transparentconductive layer 62 may be electrically connected to the lowersemiconductor layer 55 of the second light emitting cell S2.

Referring to FIG. 14, an insulation protective layer 63 is formed tocover the first and second light emitting cells S1, S2. The insulationprotective layer 63 covers the transparent electrode layer 61, thetransparent conductive layer 62 and the insulation layer 60 b. Inaddition, the insulation protective layer 63 may cover an overall areaof the first and second light emitting cells S1, S2. The insulationprotective layer 63 may be formed as an insulation material layer suchas a silicon oxide layer or a silicon nitride layer by chemical vapordeposition or the like.

Referring to FIG. 15, as described with reference to FIG. 9, a maskpattern 70 having an opening is formed on the insulation protectivelayer 63. The opening of the mask pattern 70 corresponds to an area ofthe interconnection. Next, some region of the insulation protectivelayer 63 is etched using the mask pattern 70 as a mask. As a result, anopening is formed in the insulation protective layer 63 to expose someof the transparent electrode layer 61 and the transparent conductivelayer 62, and the lower semiconductor layer 55 of the second lightemitting cell S2 therethrough. Further, a portion of the insulationlayer 60 b is exposed through the opening.

Referring to FIG. 16, as described with reference to FIG. 10, with themask pattern 70 remaining on the insulation protective layer 63, aconductive material is deposited to form an interconnection 65 in theopening of the mask pattern 70.

Next, as described with reference to FIG. 11, the mask pattern 70 isremoved together with a portion 65 a of the conductive material on themask pattern 70. Accordingly, the interconnection 65 electricallyconnecting the first and second light emitting cells S1, S2 to eachother is finally formed.

In the embodiment described with reference to FIG. 5 to FIG. 11, theinsulation layer 60 b may be damaged during etching of the insulationprotective layer 63. For example, when the insulation protective layer63 is subjected to etching using an etching solution such as fluoricacid, the insulation layer 60 b including an oxide layer may be damagedby the etching solution. Thus, the insulation layer 60 b may notinsulate the interconnection 65 from the first light emitting cell S1,thereby causing short circuit.

On the contrary, in the present exemplary embodiment, since thetransparent conductive layer 62 is disposed on the insulation layer 60b, the insulation layer 60 b under the transparent conductive layer 62can be protected from etching damage. Thus, it is possible to preventshort circuit due to the interconnection 65.

In the present exemplary embodiment, the transparent electrode layer 61and the transparent conductive layer 62 may be formed by the sameprocess. Thus, the light emitting diode can be fabricated using the samenumber of exposure processes while adding the transparent conductivelayer 62.

FIG. 17 is a schematic plan view of a light emitting diode according toan exemplary embodiment of the present invention, and FIG. 18 is aschematic sectional view taken along line B-B of FIG. 17.

Referring to FIG. 17 and FIG. 18, the light emitting diode includes asubstrate 51, light emitting cells S1, S2, a transparent electrode layer61, a current blocking layer 60 a, an insulation layer 60 b, aninsulation protective layer 63, and an interconnection 65. The lightemitting diode may further include a buffer layer 53.

The substrate 51 may be an insulating or conductive substrate. Forexample, the substrate 51 may be a sapphire substrate, a gallium nitridesubstrate, a silicon carbide (SiC) substrate, or a silicon substrate. Inaddition, the substrate 51 may be a substrate having a convex-concavepattern (not shown) on an upper surface thereof, such as a patternedsapphire substrate.

On a single substrate 51, the first light emitting cell S1 and thesecond light emitting cell S2 are separated from each other. Each of thefirst and second light emitting cells S1, S2 has a stack structure 56,which includes a lower semiconductor layer 55, an upper semiconductorlayer 59 disposed on one area of the lower semiconductor layer, and anactive layer 57 interposed between the lower semiconductor layer and theupper semiconductor layer. Here, the upper and lower semiconductorlayers may be p-type and n-type semiconductor layers, respectively, orvice versa.

Each of the lower semiconductor layer 55, the active layer 57 and theupper semiconductor layer 59 may be formed of a gallium nitride-basedmaterial, for example, (Al, In, Ga)N. The active layer 57 may be formedof a material having a composition capable of emitting light in adesired wavelength range, for example, UV or blue light, and the lowerand upper semiconductor layers 55, 59 are formed of a material having awider band gap than that of the active layer 57.

As shown, the lower semiconductor layer 55 and/or the uppersemiconductor layer 59 may be formed of a single layer or multiplelayers. In addition, the active layer 57 may have a single quantum-wellstructure or a multi-quantum well structure.

Each of the first and second light emitting cells S1, S2 may have aninclined side surface, an inclined angle of which ranges from 15° to 80°with respect to an upper surface of the substrate 51.

The active layer 57 and the upper semiconductor layer 59 are disposed onthe lower semiconductor layer 55. An upper surface of the lowersemiconductor layer 55 may be completely covered by the active layer 57such that the side surface of the lower semiconductor layer 55 can beexposed.

In FIG. 18, the first light emitting cell S1 and the second lightemitting cell S2 are partially shown. However, it should be noted thatthe first light emitting cell S1 and the second light emitting cell S2have a similar or the same structure as shown in FIG. 17. Specifically,the first and second light emitting cells S1, S2 have the same galliumnitride-based semiconductor stack structure, and may have inclined sidesurfaces of the same structure.

The buffer layer 53 may be interposed between the light emitting cellsS1, S2 and the substrate 51. The buffer layer 53 is used to relievelattice mismatch between the substrate 51 and the lower semiconductorlayer 55 formed thereon when the substrate 51 is a growth substrate.

The transparent electrode layer 61 is disposed on each of the lightemitting cells S1, S2. Specifically, a first transparent electrode layer61 is disposed on the first light emitting cell S1, and a secondtransparent electrode layer 61 is disposed on the second light emittingcell S2. The transparent electrode layer 61 may be disposed on an uppersurface of the upper semiconductor layer 59 to be connected to the uppersemiconductor layer 59, and may have a smaller area than that of theupper semiconductor layer 59. In other words, the transparent electrodelayer 61 may be recessed from an edge of the upper semiconductor layer59. Thus, the light emitting diode according to this embodiment mayprevent current crowding at the edge of the transparent electrode layer61 through the sidewalls of the light emitting cells S1, S2.

The current blocking layer 60 a may be disposed on each of the lightemitting cells S1, S2 between the transparent electrode layer 61 andeach of the light emitting cells S1, S2. A portion of the transparentelectrode layer 61 is disposed on the current blocking layer 60 a. Thecurrent blocking layer 60 a may be disposed near an edge of each of thelight emitting cells S1, S2, without being limited thereto.Alternatively, the current blocking layer 60 a may be disposed at acentral region of each of the light emitting cells S1, S2. The currentblocking layer 60 a is formed of an insulation material, andparticularly, may include a distributed Bragg reflector formed byalternately stacking layers having different indices of refraction.

The insulation layer 60 b covers a portion of the side surface of thefirst light emitting cell S1. As shown in FIG. 17 and FIG. 18, theinsulation layer 60 b may extend to an area between the first lightemitting cell S1 and the second light emitting cell S2, and may cover aportion of the side surface of the lower semiconductor layer 55 of thesecond light emitting cell S2. The insulation layer 60 b has the samestructure as that of the current blocking layer 60 a and is formed ofthe same material as that of the current blocking layer 60 a, and mayinclude a distributed Bragg reflector. The insulation layer 60 b may beformed of a different process than that of the current blocking layer 60a. When the insulation layer 60 b includes the distributed Braggreflector formed of multiple layers, it is possible to efficientlysuppress formation of defects such as pinholes in the insulation layer60 b. The insulation layer 60 b may be directly connected to the currentblocking layer 60 a to be positioned adjacent thereto, but is notlimited thereto. The insulation layer 60 b may be separated from thecurrent blocking layer 60 a.

The interconnection 65 electrically connects the first light emittingcell S1 to the second light emitting cell S2. The interconnection 65includes a first connection section 65 p and a second connection section65 n. The first connection section 65 p is electrically connected to thetransparent electrode layer 61 on the first light emitting cell S1, andthe second connection section 65 n is electrically connected to thelower semiconductor layer 55 of the second light emitting cell S2. Thefirst connection section 65 p may be disposed near one edge of the firstlight emitting cell S1, without being limited thereto. Alternatively,the first connection section 65 p may be disposed at the central regionof the first light emitting cell S1.

The second connection section 65 n may contact an inclined side surfaceof the second light emitting cell S2, particularly, an inclined sidesurface of the lower semiconductor layer 55 of the second light emittingcell S2. In addition, as shown in FIG. 17, the second connection section65 n may extend in opposite directions along the periphery of the secondlight emitting cell S2 while electrically contacting the inclined sidesurface of the lower semiconductor layer 55. The first light emittingcell S1 is connected in series to the second light emitting cell S2 bythe first and second connection sections 65 p, 65 n of theinterconnection 65.

The interconnection 65 may contact the transparent electrode layer 61over an entire overlapping area between the interconnection 65 and thetransparent electrode layer 61. In the related art, a portion of theinsulation layer 33 may be disposed between the transparent electrodelayer 31 and the interconnection 35. However, in the present exemplaryembodiment, the interconnection 65 directly contacts the transparentelectrode layer 61 without any insulating material interposedtherebetween.

Further, the current blocking layer 60 a may be disposed over the entireoverlapping area between the interconnection 65 and the transparentelectrode layer 61, and the current blocking layer 60 a and theinsulation layer 60 b may be disposed over an entire overlapping areabetween the interconnection 65 and the first light emitting cell S1. Inaddition, the insulation layer 60 b may be disposed between the secondlight emitting cell S2 and the interconnection 65 except for aconnection area between the interconnection 65 and the second lightemitting cell S2.

Although the first connection section 65 p and the second connectionsection 65 n of the interconnection 65 are illustrated as beingconnected to each other via two paths in FIG. 17, the first connectionsection 65 p and the second connection section 65 n may be connected toeach other via a single path.

When the current blocking layer 60 a and the insulation layer 60 b havereflective characteristics like distributed Bragg reflectors, thecurrent blocking layer 60 a and the insulation layer 60 b may besubstantially within the same area as that of the interconnection 65 inan area two times or less than that of the interconnection 65. Thecurrent blocking layer 60 a and the insulation layer 60 b preventabsorption of light by the interconnection 65 when light is emitted fromthe active layer 57. However, when the current blocking layer 60 a andthe insulation layer 60 b occupy an excessively large area, there is apossibility of blocking discharge of light. Thus, it may be necessary tolimit the area of the current blocking layer 60 a and the insulationlayer 60 b.

The insulation protective layer 63 may be disposed outside the area ofthe interconnection 65. The insulation protective layer 63 covers thefirst and second light emitting cells S1, S2 outside the area of theinterconnection 65. The insulation protective layer 63 may be formed ofa silicon oxide layer (SiO₂) or a silicon nitride layer. The insulationprotective layer 63 is formed with an opening through which thetransparent electrode layer 61 on the first light emitting cell S1 andthe lower semiconductor layer of the second light emitting cell S2 areexposed, and the interconnection 65 may be disposed within this opening

A side surface of the insulation protective layer 63 and a side surfaceof the interconnection 65 may be disposed to face each other, or tocontact each other. Alternatively, the side surface of the insulationprotective layer 63 may be separated from the side surface of theinterconnection 65 to face each other.

According to this embodiment, since the second connection section 65 nof the interconnection 65 electrically contacts the inclined sidesurface of the second light emitting cell S2, there is no need forexposure of an upper surface of the lower semiconductor layer 55 of thesecond light emitting cell S2. Thus, there is no need for partialremoval of the upper semiconductor layer 59 and the active layer 57,thereby increasing an effective light emitting area of the lightemitting diode.

In addition, the current blocking layer 60 a and the insulation layer 60b may be formed of the same material and have the same structure, andthus may be formed by the same process. Further, since theinterconnection 65 is disposed within the opening of the insulationprotective layer 63, the insulation protective layer 63 and theinterconnection 65 may be formed using the same mask pattern.

In this embodiment, the light emitting diode is illustrated as includingtwo light emitting cells, that is, the first light emitting cell S1 andthe second light emitting cell S2. However, the present invention is notlimited to the two light emitting cells, and more light emitting cellsmay be electrically connected to each other by interconnections 65. Forexample, the interconnections 65 may electrically connect the lowersemiconductor layers 55 of adjacent light emitting cells to thetransparent electrode layers 61 thereof to form a series array of thelight emitting cells. The light emitting diode according to thisembodiment may include a plurality of such arrays, which is connected toeach other in reverse parallel and connected to an AC source. Inaddition, the light emitting diode may be provided with a bridgerectifier (not shown) connected to the series array of light emittingcells, such that the light emitting cells can be driven by an AC source.The bridge rectifier may be formed by connecting the light emittingcells having the same structure as that of the light emitting cells S1,S2 using the interconnections 65.

FIG. 19 to FIG. 25 are sectional views illustrating a method offabricating a light emitting diode according to one embodiment of theinvention.

Referring to FIG. 19, a semiconductor stack structure 56 is formed on asubstrate 51, and includes a lower semiconductor layer 55, an activelayer 57 and an upper semiconductor layer 59. In addition, beforeformation of the lower semiconductor layer 55, a buffer layer 53 may beformed on the substrate 51.

The substrate 51 may be a sapphire (Al₂O₃) substrate, a silicon carbide(SiC) substrate, a zinc oxide (ZnO) substrate, a silicon (Si) substrate,a gallium arsenide (GaAs), a gallium phosphide (GaP) substrate, alithium alumina (LiAl₂O₃) substrate, a boron nitride (BN) substrate, analuminum nitride (AlN) substrate, or a gallium nitride (GaN) substrate,without being limited thereto. That is, the substrate 51 may be selectedfrom among various materials dependent upon materials of semiconductorlayers to be formed thereon. In addition, the substrate 51 may be asubstrate having a convex-concave pattern (not shown) on an uppersurface thereof, such as a patterned sapphire substrate.

The buffer layer 53 is formed to relieve lattice mismatch between thesubstrate 51 and the semiconductor layer 55 formed thereon, and may beformed of, for example, gallium nitride (GaN) or aluminium nitride(AlN). When the substrate 51 is a conductive substrate, the buffer layer53 may be formed as an insulation layer or a semi-insulation layer, forexample, AlN or semi-insulation GaN.

Each of the lower semiconductor layer 55, the active layer 57 and theupper semiconductor layer 59 may be formed of a gallium nitride-basedsemiconductor material, for example, (Al, In, Ga)N. The lower and uppersemiconductor layers 55, 59 and the active layer 57 may bediscontinuously or continuously formed by metal organic chemical vapordeposition (MOCVD), molecular beam epitaxy, hydride vapor phase epitaxy(HYPE), and the like.

Here, the lower and upper semiconductor layers are n-type and p-typesemiconductor layers, respectively, or vice versa. The n-typesemiconductor layer is formed by doping a gallium nitride-based compoundsemiconductor layer with, for example, silicon (Si) impurities, and thep-type semiconductor layer is formed by doping the gallium nitride-basedcompound semiconductor layer with, for example, magnesium (Mg)impurities.

Referring to FIG. 20, a plurality of light emitting cells S1, S2 isformed to be separated from each other by photolithography and etching.Each of the light emitting cells 51, S2 has an inclined side surface. Ina conventional method of fabricating a light emitting diode,photolithography and etching processes are added to expose a portion ofan upper surface of the lower semiconductor layer 55 of each of thelight emitting cells S1, S2. In this embodiment, however, thephotolithography and etching processes for partially exposing the uppersurface of the lower semiconductor layer 55 are omitted.

Referring to FIG. 21, a current blocking layer 60 a covering a partialarea of the first light emitting cell 51 is formed together with aninsulation layer 60 b covering a partial area of a side surface of thefirst light emitting cell 51. The insulation layer 60 b may also extendto cover an area between the first light emitting cell 51 and the secondlight emitting cell S2, and may cover a portion of the side surface ofthe lower semiconductor layer 55 of the second light emitting cell S2.

The current blocking layer 60 a and the insulation layer 60 b may beformed by depositing an insulation material layer, followed bypatterning the insulation material layer through photolithography andetching. Alternatively, the current blocking layer 60 a and theinsulation layer 60 b may be formed as insulation material layersthrough a lift-off process. In particular, the current blocking layer 60a and the insulation layer 60 b may be formed as distributed Braggreflectors by alternately stacking layers having different indices ofrefraction, for example, a SiO₂ layer and a TiO₂ layer. When theinsulation layer 60 b is a distributed Bragg reflector formed ofmultiple layers, it is possible to prevent formation of defects such aspinholes in the insulation layer 60 b, whereby the insulation layer 60 bmay be formed to be relatively thin as compared with conventionaltechniques.

As shown in FIG. 21, the current blocking layer 60 a and the insulationlayer 60 b may be connected to each other, without being limitedthereto.

Next, a transparent electrode layer 61 is formed on the first and secondlight emitting cells S1, S2. The transparent electrode layer 61 may beformed of a conductive material such as indium tin oxide (ITO) or zincoxide, or a metal layer such as Ni/Au. The transparent electrode layer61 is connected to the upper semiconductor layer 59 and is partiallydisposed on the current blocking layer 60 a. The transparent electrodelayer 61 may be formed by a lift-off process, without being limitedthereto. Alternatively, the transparent electrode layer 61 may be formedby photolithography and etching.

Referring to FIG. 22, an insulation protective layer 63 is formed tocover the first and second light emitting cells S1, S2. The insulationprotective layer 63 covers the transparent electrode layer 61 and theinsulation layer 60 b. In addition, the insulation protective layer 63may cover an overall area of the first and second light emitting cellsS1, S2. The insulation protective layer 63 may be formed as aninsulation material layer such as a silicon oxide layer or a siliconnitride layer by chemical vapor deposition or the like.

Referring to FIG. 23, a mask pattern 70 having an opening is formed onthe insulation protective layer 63. The opening of the mask pattern 70corresponds to an area of the interconnection. Next, some region of theinsulation protective layer 63 is etched using the mask pattern 70 as amask. As a result, an opening is formed in the insulation protectivelayer 63 to expose some of the transparent electrode layer 61 and theinsulation layer 60 b, and an inclined side surface of the lowersemiconductor layer 55 of the second light emitting cell S2therethrough.

Referring to FIG. 24, with the mask pattern 70 remaining on theinsulation protective layer 63, a conductive material is deposited toform an interconnection 65 in the opening of the mask pattern 70. Atthis point, a portion 65 a of the conductive material may be depositedon the mask pattern 70. The conductive material may be deposited byplating, electron-beam evaporation or sputtering.

Referring to FIG. 25, the mask pattern 70 is removed together with theportion 65 a of the conductive material on the mask pattern 70.Accordingly, the interconnection 65 electrically connecting the firstand second light emitting cells S1, S2 to each other is finally formed.

Here, a first connection section 65 p of the interconnection 65 isconnected to the transparent electrode layer 61 of the first lightemitting cell S1, and a second connection section 65 n of theinterconnection 65 is connected to the inclined side surface of thelower semiconductor layer 55 of the second light emitting cell S2. Thefirst connection section 65 p of the interconnection 65 is connected tothe transparent electrode layer 60 a within an upper area of the currentblocking layer 60 a. The interconnection 65 is separated from the sidesurface of the first light emitting cell S1 by the insulation layer 60b.

In this embodiment, the current blocking layer 60 a and the insulationlayer 60 b are formed by the same process. Accordingly, the insulationprotective layer 63 and the interconnection 65 may be formed using thesame mask pattern 70, whereby the light emitting diode can be fabricatedusing the same number of exposure processes while adding the currentblocking layer 60 a.

FIG. 26 is a schematic sectional view of a light emitting diodeaccording to an exemplary embodiment of the present invention.

Referring to FIG. 26, the light emitting diode according to the presentexemplary embodiment is generally similar to the light emitting devicedescribed with reference to FIG. 17 and FIG. 18, and further includes atransparent conductive layer 62.

In the light emitting diode according to this embodiment, a substrate51, light emitting cells S1, S2, a buffer layer 53, a transparentelectrode layer 61, a current blocking layer 60 a, an insulation layer60 b, an insulation protective layer 63 and an interconnection 65 aresimilar to those of the light emitting diode according to the aboveembodiment described with reference to FIG. 17 and FIG. 18, and detaileddescriptions thereof will be omitted.

The transparent conductive layer 62 is disposed between the insulationlayer 60 b and the interconnection 65. The transparent conductive layer62 has a narrower line width than the insulation layer 60 b, therebypreventing short circuit of the upper semiconductor layer 59 and thelower semiconductor layer 55 due to the transparent conductive layer 62.

On the other hand, the transparent conductive layer 62 is connected tothe first transparent electrode layer 61, and may connect the firsttransparent electrode layer 61 to the second light emitting cell S2. Forexample, one end of the transparent conductive layer 62 may beelectrically connected to the lower semiconductor layer 55 of the secondlight emitting cell. In addition, when two or more light emitting cellsare connected to each other, a second transparent conductive layer 62may extend from a second transparent electrode layer 61 on the secondlight emitting cell S2.

In this embodiment, since the transparent conductive layer 62 isdisposed between the interconnection 65 and the insulation layer 60 b,electric current can flow through the transparent conductive layer 62even in the case where the interconnection 65 is disconnected, therebyimproving electric stability of the light emitting diode.

FIG. 27 to FIG. 30 are schematic sectional views illustrating a methodof fabricating a light emitting diode according to the exemplaryembodiment of FIG. 26.

Referring to FIG. 27, as in the method described with reference to FIG.19 and FIG. 20, a semiconductor stack structure 56 is formed on asubstrate 51 and a plurality of light emitting cells S1, S2 is formed tobe separated from each other via photolithography and etching. Then, asdescribed with reference to FIG. 21, a current blocking layer 60 acovering a partial area of the first light emitting cell S1 is formedtogether with an insulation layer 60 b covering a partial area of a sidesurface of the first light emitting cell S1.

As described with reference to FIG. 21, the current blocking layer 60 aand the insulation layer 60 b may be formed as distributed Braggreflectors by alternately stacking layers having different indices ofrefraction, for example, a SiO₂ layer and a TiO₂ layer. When theinsulation layer 60 b is a distributed Bragg reflector formed ofmultiple layers, it is possible to prevent formation of defects such aspinholes in the insulation layer 60 b, whereby the insulation layer 60 bmay be formed to be relatively thin as compared with conventionaltechniques.

Next, a transparent electrode layer 61 is formed on the first and secondlight emitting cells S1, S2. As described with reference to FIG. 21, thetransparent electrode layer 61 may be formed of a conductive materialsuch as indium tin oxide (ITO) or zinc oxide, or a metal layer such asNi/Au. The transparent electrode layer 61 is connected to the uppersemiconductor layer 59 and is partially disposed on the current blockinglayer 60 a. The transparent electrode layer 61 may be formed by alift-off process, without being limited thereto. Alternatively, thetransparent electrode layer 61 may be formed by photolithography andetching.

During formation of the transparent electrode layer 61, a transparentconductive layer 62 is also formed. The transparent conductive layer 62may be formed of the same material as that of the transparent electrodelayer 61 through the same process. The transparent conductive layer 62is formed on the insulation layer 60 b, and may be connected to thetransparent electrode layer 61. Further, one end of the transparentconductive layer 62 may be electrically connected to an inclined sidesurface of the lower semiconductor layer 55 of the second light emittingcell S2.

Referring to FIG. 28, an insulation protective layer 63 is formed tocover the first and second light emitting cells S1, S2. The insulationprotective layer 63 covers the transparent electrode layer 61, thetransparent conductive layer 62 and the insulation layer 60 b. Inaddition, the insulation protective layer 63 may cover an overall areaof the first and second light emitting cells S1, S2. The insulationprotective layer 63 may be formed as an insulation material layer suchas a silicon oxide layer or a silicon nitride layer by chemical vapordeposition or the like.

Referring to FIG. 29, as described with reference to FIG. 23, a maskpattern 70 having an opening is formed on the insulation protectivelayer 63. The opening of the mask pattern 70 corresponds to an area ofthe interconnection. Next, some region of the insulation protectivelayer 63 is etched using the mask pattern 70 as a mask. As a result, anopening is formed in the insulation protective layer 63 to expose someof the transparent electrode layer 61 and the transparent conductivelayer 62, and the inclined side surface of the lower semiconductor layer55 of the second light emitting cell S2 therethrough. A portion of theinsulation layer 60 b is exposed through the opening. Further, a portionof the insulation layer 60 b is exposed through the opening.

Referring to FIG. 30, as described with reference to FIG. 24, with themask pattern 70 remaining on the insulation protective layer 63, aconductive material is deposited to form an interconnection 65 in theopening of the mask pattern 70.

Next, as described with reference to FIG. 25, the mask pattern 70 isremoved together with a portion 65 a of the conductive material on themask pattern 70. Accordingly, the interconnection 65 electricallyconnecting the first and second light emitting cells S1, S2 to eachother is finally formed.

In the embodiment described with reference to FIG. 19 to FIG. 25, theinsulation layer 60 b may be damaged during etching of the insulationprotective layer 63. For example, when the insulation protective layer63 is subjected to etching using an etching solution such as fluoricacid, the insulation layer 60 b including an oxide layer may be damagedby the etching solution. Thus, the insulation layer 60 b may notinsulate the interconnection 65 from the first light emitting cell S1,thereby causing short circuit.

In the present exemplary embodiment, since the transparent conductivelayer 62 is disposed on the insulation layer 60 b, the insulation layer60 b under the transparent conductive layer 62 can be protected frometching damage. Thus, it is possible to prevent short circuit due to theinterconnection 65.

In this embodiment, the transparent electrode layer 61 and thetransparent conductive layer 62 may be formed by the same process. Thus,the light emitting diode can be fabricated using the same number ofexposure processes while adding the transparent conductive layer 62.

Although the invention has been illustrated with reference to someembodiments in conjunction with the drawings, it will be apparent tothose skilled in the art that various modifications and changes can bemade to the invention without departing from the spirit and scope of theinvention. Further, it should be understood that some features of acertain embodiment may also be applied to other embodiments withoutdeparting from the spirit and scope of the invention. Therefore, itshould be understood that the embodiments are provided by way ofillustration only and are given to provide complete disclosure of theinvention and to provide thorough understanding of the invention tothose skilled in the art. Thus, it is intended that the invention coverthe modifications and variations provided they fall within the scope ofthe appended claims and their equivalents.

What is claimed is:
 1. A light emitting diode, comprising: a first lightemitting cell and a second light emitting cell disposed on a substrate,the first light emitting cell and the second light emitting cell beingspaced apart from each other; a first zinc oxide (ZnO) layer disposed onthe first light emitting cell, the first ZnO layer being electricallyconnected to the first light emitting cell; a current blocking layerdisposed between a portion of the first light emitting cell and thefirst ZnO layer; an interconnection electrically connecting the firstlight emitting cell and the second light emitting cell; and aninsulation layer disposed between the interconnection and a side surfaceof the first light emitting cell, wherein the current blocking layer anda first side of the insulation layer are connected to each other.
 2. Thelight emitting diode of claim 1, wherein the current blocking layer andthe insulation layer comprise distributed Bragg reflectors.
 3. The lightemitting diode of claim 1, wherein the current blocking layer and theinsulation layer are disposed between the first light emitting cell andthe interconnection in an entire overlapping area between the firstlight emitting cell and the interconnection.
 4. The light emitting diodeof claim 3, wherein the insulation layer is disposed between theinterconnection and the side surface of the second light emitting cell.5. The light emitting diode of claim 4, further comprising: aninsulation protective layer disposed on the first light emitting celland the second light emitting cell, the insulation protective layerbeing disposed outside an area in which the interconnection is disposed.6. The light emitting diode of claim 5, wherein a side surface of theinsulation protective layer contacts a side surface of theinterconnection on a coplanar surface.
 7. The light emitting diode ofclaim 1, further comprising: a first transparent conductive layerdisposed between the insulation layer and the interconnection.
 8. Thelight emitting diode of claim 7, wherein the first transparentconductive layer is connected to the first ZnO layer.
 9. The lightemitting diode of claim 1, wherein each of the first and second lightemitting cells comprises a lower semiconductor layer, an uppersemiconductor layer, and an active layer disposed between the lowersemiconductor layer and the upper semiconductor layer, wherein the firstZnO layer is electrically connected to the upper semiconductor layer,and wherein the interconnection contacts the first ZnO layer at a firstend thereof and the lower semiconductor layer of the second lightemitting cell at a second end thereof.
 10. The light emitting diode ofclaim 9, wherein the interconnection is directly connected to the firstZnO layer over an entire overlapping area therebetween.
 11. The lightemitting diode of claim 10, wherein the current blocking layer isdisposed at least under the direct connection area between the first ZnOlayer and the interconnection.
 12. The light emitting diode of claim 9,wherein the first light emitting cell and the second light emitting cellcomprise the same structure.
 13. The light emitting diode of claim 1,wherein the current blocking layer and the insulation layer comprisedistributed Bragg reflectors comprising the same structure, and comprisethe same material.
 14. The light emitting diode of claim 13, wherein theinterconnection is directly connected to the first ZnO layer over anentire overlapping area therebetween.
 15. The light emitting diode ofclaim 13, wherein the distributed Bragg reflectors are disposed underthe interconnection over an entire area of the interconnection.
 16. Thelight emitting diode of claim 1, wherein the second light emitting cellhas an inclined side surface, and the interconnection comprises a firstconnection section connected to the first light emitting cell and asecond connection section connected to the second light emitting cell,the first connection section contacting the first ZnO layer within anupper area of the current blocking layer, the second connection sectioncontacting the inclined side surface of the second light emitting cell.17. A light emitting diode, comprising: a first light emitting cell anda second light emitting cell disposed on a substrate, the first lightemitting cell and the second light emitting being spaced apart from eachother; a first transparent electrode layer disposed on the first lightemitting cell, the first transparent electrode layer being electricallyconnected to the first light emitting cell; a current blocking layerdisposed between a portion of the first light emitting cell and thefirst transparent electrode layer; an interconnection electricallyconnecting the first light emitting cell and the second light emittingcell; and an insulation layer disposed between the interconnection and afirst side surface of the first light emitting cell, wherein the currentblocking layer and the insulation layer are connected to each other;wherein the first transparent electrode layer is extended to cover asecond side surface of the insulation layer, and wherein the first sidesurface is opposite to the second side surface.
 18. The light emittingdiode of claim 17, wherein at least one of the current blocking layerand the insulation layer comprise distributed Bragg reflectors.